STRAIN MATCHING OF CRYSTALS AND HORIZONTALLY-SPACED MONOCHROMATOR AND ANALYZER CRYSTAL ARRAYS IN DIFFRACTION ENHANCED IMAGING SYSTEMS AND RELATED METHODS

摘要

Strain matching of crystals and horizontally-spaced monochromator and analyzercrystal arrays in diffractionenhanced imaging systems and related methods are disclosed. A DEI system,including strain matched crystals can comprise anX--ray source configured to generate a first X-ray beam. A first monochromatorcrystal can be positioned to intercept the first X-raybeam for producing a second X-ray beam. A second monochromator crystal can bepositioned to intercept the second X-ray beamto produce a third X-ray beam for transmission through an object. The secondmonochromator crystal has a thickness selectedsuch that a mechanical strain on a side of the first monochromator crystal isthe same as a mechanical strain on the secondmonochromator crystal. An analyzer crystal has a thickness selected such thata mechanical strain on a side of the firstmonochromator crystal is the same as a mechanical strain on the analyzercrystal.