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X-ray fluorescence analyzer having means for producing lowered pressure, and an X-ray fluorescence measurement method using lowered pressure

机译:具有降低压力的装置的X射线荧光分析仪以及使用降低的压力的X射线荧光测量方法

摘要

An X-ray fluorescence analyzer has a structure that defines a chamber (102, 505). There is a window (103) to the chamber in a surface that is to come next to a sample (101) outside the chamber. The window (103) comprises a foil that is permeable to X-rays. A detector (104) receives fluorescent X-rays through said window (103). A low pressure source (508) is coupled to the chamber (102, 505) and configured to controllably lower the pressure of a gaseous medium in the chamber (102, 505) to a pressure value between 760 torr and 10 torr. The X-ray fluorescence analyzer maintains a lowered pressure of a value between 760 torr and 10 torr in the chamber (102, 505) for the duration of an X-ray fluorescence measurement.
机译:X射线荧光分析仪具有限定腔室(102、505)的结构。在腔室外的样品表面(101)旁边的表面上有一个腔室窗口(103)。窗口(103)包括可透过X射线的箔。检测器(104)通过所述窗口(103)接收荧光X射线。低压源(508)联接至腔室(102、505),并且构造成将腔室(102、505)中的气态介质的压力可控制地降低至760托和10托之间的压力值。在X射线荧光测量的持续时间内,X射线荧光分析仪在腔室(102、505)中将压力保持在760托和10托之间的降低的压力。

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