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Hysteresis characteristic setting device and hysteresis characteristic setting method

机译:磁滞特性设定装置及磁滞特性设定方法

摘要

For providing a hysteresis characteristic setting device configured by components smaller in number than those of a logic circuit or a comparator circuit for setting a hysteresis characteristic, the device comprises a resistor voltage dividing circuit including two resistors (R1,R2); and a microcomputer (30) including first and second ports (I1,I2) and serving as input ports. When an output signal from a low-pass filter circuit (10) is supplied to the device; the voltage of the signal is divided by the two resistors of the resistor voltage dividing circuit and then given to the second port. The microcomputer performs a process according to a combination of levels Hi and Lo detected in the ports, to set a hysteresis characteristic in which an input voltage level corresponding to a threshold voltage level of the first port is a lower limit, and that corresponding to a threshold voltage level of the second port is an upper limit.
机译:为了提供一种磁滞特性设定装置,该磁滞特性设定装置的数量少于用于设定磁滞特性的逻辑电路或比较器电路的数量,该装置包括电阻分压电路,该电阻分压电路包括两个电阻器(R1,R2)。微型计算机(30),其包括第一和第二端口(I1,I2)并用作输入端口。当来自低通滤波器电路(10)的输出信号被提供给设备时;信号的电压由电阻分压电路的两个电阻分压,然后提供给第二个端口。微型计算机根据在端口中检测到的电平Hi和Lo的组合执行处理,以设置磁滞特性,其中与第一端口的阈值电压电平相对应的输入电压电平为下限,而与第一端口的阈值电压电平相对应的输入电压电平为下限。第二端口的阈值电压电平为上限。

著录项

  • 公开/公告号EP1404018B1

    专利类型

  • 公开/公告日2011-09-14

    原文格式PDF

  • 申请/专利权人 JTEKT CORP;

    申请/专利号EP20030021775

  • 发明设计人 NORITO YASUJIKOYO SEIKO CO. LTD.;

    申请日2003-09-25

  • 分类号H03K3/3565;H03K3/0233;

  • 国家 EP

  • 入库时间 2022-08-21 17:59:39

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