首页> 外国专利> PROCESS FOR PRODUCING MODIFIED POROUS SILICA FILM, MODIFIED POROUS SILICA FILM OBTAINED BY THE PROCESS, AND SEMICONDUCTOR DEVICE EMPLOYING THE MODIFIED POROUS SILICA FILM

PROCESS FOR PRODUCING MODIFIED POROUS SILICA FILM, MODIFIED POROUS SILICA FILM OBTAINED BY THE PROCESS, AND SEMICONDUCTOR DEVICE EMPLOYING THE MODIFIED POROUS SILICA FILM

机译:制备改性多孔二氧化硅膜,由该方法获得的改性多孔二氧化硅膜的方法以及采用该改性多孔二氧化硅膜的半导体装置

摘要

A hydrophobic compound having at least one each of hydrophobic group (an alkyl group having 1 to 6 carbon atoms or a -C 6 H 5 group) and polymerizable group (a hydrogen atom, a hydroxyl group or a halogen atom) is allowed to undergo a gas-phase polymerization reaction, under reduced pressure (of not more than 30 kPa), in the presence of a raw porous silica film and to thus form a modified porous silica film wherein a hydrophobic polymer thin film is formed on the inner walls of holes present in the raw porous silica film. The resulting porous silica film has a low relative dielectric constant and a low refractive index and the silica film is likewise improved in the mechanical strength and hydrophobicity. A semiconductor device is produced using the porous silica film.
机译:使具有疏水基团(具有1-6个碳原子的烷基或-C 6 H 5基团)和可聚合基团(氢原子,羟基或卤素原子)中的至少一个的疏水化合物进行在未加工的多孔二氧化硅膜的存在下,在减压(不大于30kPa)下进行气相聚合反应,从而形成改性的多孔二氧化硅膜,其中在聚合物的内壁上形成疏水性聚合物薄膜。粗多孔二氧化硅膜中存在孔。所得的多孔二氧化硅膜具有较低的相对介电常数和较低的折射率,并且二氧化硅膜的机械强度和疏水性同样得到改善。使用多孔二氧化硅膜制造半导体器件。

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