首页> 外国专利> A METHOD FOR PROGRAMMING AND ERASING AN ARRAY OF NMOS EEPROM CELLS THAT MINIMIZE BIT DISTURBANCES AND VOLTAGE WITHSTAND REQUIREMENTS FOR THE MEMORY ARRAY AND SUPPORTING CIRCUITS

A METHOD FOR PROGRAMMING AND ERASING AN ARRAY OF NMOS EEPROM CELLS THAT MINIMIZE BIT DISTURBANCES AND VOLTAGE WITHSTAND REQUIREMENTS FOR THE MEMORY ARRAY AND SUPPORTING CIRCUITS

机译:一种对NMOS EEPROM单元进行编程和擦除的方法,该方法可最大程度地减少位错和电压,并满足存储阵列和支持电路的要求

摘要

A method for programming and erasing an array of NMOS electrically erasable programmable read only memory (EEPROM) cells that minimizes bit disturbances and high voltage requirements for the memory array cells and supporting circuits. In addition, the array of N-channel memory cells may be separated into independently programmable memory segments by creating multiple, electrically isolated P-wells upon which the memory segments are fabricated. The multiple, electrically isolated P-wells may be created, for example, by p-n junction isolation or dielectric isolation.
机译:一种用于对NMOS电可擦可编程只读存储器(EEPROM)单元的阵列进行编程和擦除的方法,该方法使存储阵列单元和支持电路的位干扰和高电压要求最小化。另外,可以通过创建多个电隔离的P阱来将N沟道存储单元的阵列分离成独立可编程的存储段,在其上制造存储段。多个电隔离的P阱可以例如通过p-n结隔离或电介质隔离来创建。

著录项

  • 公开/公告号EP2030206B1

    专利类型

  • 公开/公告日2011-07-06

    原文格式PDF

  • 申请/专利权人 MICROCHIP TECH INC;

    申请/专利号EP20070797769

  • 申请日2007-05-25

  • 分类号G11C16/00;

  • 国家 EP

  • 入库时间 2022-08-21 17:58:05

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