首页> 外国专利> NDIR DUAL TRACE GAS ANALYZER AND METHOD FOR DETERMINING THE CONCENTRATION OF A MEASUREMENT GAS COMPONENT IN A GAS MIXTURE BY MEANS OF SUCH A GAS ANALYZER

NDIR DUAL TRACE GAS ANALYZER AND METHOD FOR DETERMINING THE CONCENTRATION OF A MEASUREMENT GAS COMPONENT IN A GAS MIXTURE BY MEANS OF SUCH A GAS ANALYZER

机译:NDIR双痕量气体分析仪及通过这种气体分析仪测定混合气中测量气体成分浓度的方法

摘要

The modulator wheel (10) of the gas analyzer contains an opening in the shadowing part thereof, said opening generating in addition to the signal component (Sa1f, Sb1f) at the modulation frequency (f) generated by alternating shadowing and passing-through of the radiation (2), a further signal component (Sa2f, Sb2f) having twice the modulation frequency (f), in the measurement signal (Sa, Sb) of the gas analyzer. The further signal component (Sa2f, Sb2f) is used for detecting changes to the infrared radiation source (1) or detector arrangement (12) due to contamination, aging, or temperature, and compensating for the effects thereof on the measurement result (M).
机译:气体分析仪的调制轮(10)在其阴影部分包含一个开口,该开口除了产生信号分量(Sa 1f ,Sb 1f )之外还产生辐射(2)的交替遮蔽和通过所产生的调制频率(f),另一信号分量(Sa 2f, Sb 2f )具有两倍的调制气体分析仪的测量信号(Sa,Sb)中的频率(f)。另一个信号分量(Sa 2f ,Sb 2f )用于检测由于污染,老化,红外辐射源(1)或检测器装置(12)的变化。或温度,并补偿其对测量结果(M)的影响。

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