首页> 外国专利> SEMICONDUCTOR DEVICE METAL CONTACT FORMING METHOD, CAPABLE OF PREVENTING THE GENERATION OF A BRIDGE DURING FORMING THE METAL WITH THE SEAM

SEMICONDUCTOR DEVICE METAL CONTACT FORMING METHOD, CAPABLE OF PREVENTING THE GENERATION OF A BRIDGE DURING FORMING THE METAL WITH THE SEAM

机译:半导体装置的金属接触成形方法,能够防止在金属与焊缝成形过程中桥接的产生

摘要

PURPOSE: A semiconductor device metal contact forming method is provided to prevent the generation of the bridge during forming the metal contact by removing the seam which occurs in the intermediate layer using a barrier layer.;CONSTITUTION: A capacitor having the cylinder type storage electrode(150) is formed on a semiconductor substrate(100). An intermediate insulation layer(180) is formed on the result material formed with the capacitor. A contact hole is formed to form the metal contact by etching the intermediate insulation layer. A barrier film(200) consisting of the tantalum oxide is formed on the sidewall of the contact hole.;COPYRIGHT KIPO 2011
机译:目的:提供一种半导体器件金属触点形成方法,以通过使用阻挡层去除中间层中出现的接缝来防止在形成金属触点时产生电桥;组成:一种具有圆柱型存储电极的电容器(在半导体衬底(100)上形成150)。在由电容器形成的结果材料上形成中间绝缘层(180)。通过蚀刻中间绝缘层形成接触孔以形成金属接触。在接触孔的侧壁上形成由氧化钽构成的阻挡膜(200)。;COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20100138467A

    专利类型

  • 公开/公告日2010-12-31

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20090057012

  • 发明设计人 JANG JUN SOO;PARK DONG SU;LEE EUN A;

    申请日2009-06-25

  • 分类号H01L21/28;

  • 国家 KR

  • 入库时间 2022-08-21 17:53:03

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