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INSPECTION APPARATUS FOR LED HAVING TRANSTERING UNIT AND METHOD OF LED TRANSFER LED USING THE SAME

机译:具有传花单元的LED检查装置及使用该检查装置的LED传送方法

摘要

PURPOSE: A light emitting diode chip inspecting apparatus equipped with a light emitting diode chip transferring unit and a light emitting diode chip transferring method using the same are provided to minimize the breakage of a light emitting diode chip while the light emitting diode chip is transferred using a gripper. CONSTITUTION: A wafer includes light emitting diode chips and the adhering faces of the light emitting diode chips. A stage(163) is arranged on the bottom side of the wafer and includes needles and curved surfaces. The needles pressurize the bottom side of the light emitting diode chips. A gripper(161) inhales the light emitting diode chips on the upper side of the wafer and transfers the inhaled light emitting diode chips.
机译:用途:提供了一种配备有发光二极管芯片传送单元的发光二极管芯片检查设备和使用该装置的发光二极管芯片传送方法,以在使用发光二极管芯片传送单元来传送发光二极管芯片时,使发光二极管芯片的损坏最小化。抓手。组成:一个晶圆,包括发光二极管芯片和发光二极管芯片的粘附面。台(163)布置在晶片的底侧上,并包括针和弯曲表面。针对发光二极管芯片的底侧加压。夹持器(161)吸入晶片上侧的发光二极管芯片,并转移吸入的发光二极管芯片。

著录项

  • 公开/公告号KR101004416B1

    专利类型

  • 公开/公告日2010-12-28

    原文格式PDF

  • 申请/专利权人 INNOBIZ CO. LTD.;

    申请/专利号KR20100057270

  • 发明设计人 JUNG BYUNG HO;

    申请日2010-06-16

  • 分类号G01R31/26;H01L21/66;

  • 国家 KR

  • 入库时间 2022-08-21 17:52:50

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