首页> 外国专利> SYSTEM AND A METHOD FOR MEASURING THE REFRACTIVE INDEX OF PLATE-SHAPED SAMPLE USING THE INTERFERENCE OF TRANSMITTED LIGHT AND REFLECTED LIGHT WITH IMPROVED MEASURING ACCURACY

SYSTEM AND A METHOD FOR MEASURING THE REFRACTIVE INDEX OF PLATE-SHAPED SAMPLE USING THE INTERFERENCE OF TRANSMITTED LIGHT AND REFLECTED LIGHT WITH IMPROVED MEASURING ACCURACY

机译:利用透射光和反射光对测量精度提高的干涉来测量板状样品的折射率的系统和方法

摘要

PURPOSE: A system and a method for measuring the refractive index of a plate-shaped sample using the interference of transmitted light and reflected light are provided to cost-efficiently and accurately measure the refractive index of plate-shaped media.;CONSTITUTION: A system for measuring the refractive index of a plate-shaped sample using the interference of transmitted light and reflected light comprises a laser light source(11), a light detecting unit(14), and a calculation unit. The laser light source irradiates beams to a plate-shaped sample(13). The light detecting unit measures the intensity of transmitted light or reflected light from the laser light source. The calculation unit calculates the relative refractive index and thickness of the sample.;COPYRIGHT KIPO 2011
机译:目的:提供一种利用透射光和反射光的干涉来测量板状样品的折射率的系统和方法,以经济高效,准确地测量板状介质的折射率。用于利用透射光和反射光的干涉来测量板状样品的折射率的装置包括激光光源(11),光检测单元(14)和计算单元。激光光源向板状样品(13)照射光束。光检测单元测量来自激光源的透射光或反射光的强度。计算单元计算样品的相对折射率和厚度。; COPYRIGHT KIPO 2011

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