首页> 外国专利> APPARATUS FOR MEASURING LUMINOSITY DISTRIBUTION, AND METHOD FOR MEASURING THE LUMINOSITY DISTRIBUTION USING THE SAME

APPARATUS FOR MEASURING LUMINOSITY DISTRIBUTION, AND METHOD FOR MEASURING THE LUMINOSITY DISTRIBUTION USING THE SAME

机译:测量发光度分布的装置和使用相同方法测量发光度分布的方法

摘要

PURPOSE: A device for measuring light intensity distribution and a method thereof are provided to effectively measure the light intensity distribution and temperature change of a light sample, thereby efficiently measuring light features and thermal features of the light sample. CONSTITUTION: A sample support unit(110) supports a light sample. The sample support unit includes a temperature adjusting unit which adjusts the temperature of the light sample. A photometer(120) measures light intensity distribution of the light sample. A driving unit(130) changes the relative location of the photometer for the light sample. A controller(140) controls the sample support unit and the driving unit.
机译:目的:提供一种用于测量光强度分布的装置及其方法,以有效地测量光样品的光强度分布和温度变化,从而有效地测量光样品的光特征和热特征。组成:样品支撑单元(110)支撑轻样品。样品支撑单元包括温度调节单元,该温度调节单元调节轻样品的温度。光度计(120)测量光样本的光强度分布。驱动单元(130)改变用于光样本的光度计的相对位置。控制器(140)控制样本支持单元和驱动单元。

著录项

  • 公开/公告号KR20110051766A

    专利类型

  • 公开/公告日2011-05-18

    原文格式PDF

  • 申请/专利权人 SAMSUNG LED CO. LTD.;

    申请/专利号KR20090108524

  • 发明设计人 KIM HEE DONG;KANG DONG HOON;

    申请日2009-11-11

  • 分类号H01L21/66;H01L33/02;

  • 国家 KR

  • 入库时间 2022-08-21 17:51:57

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