首页> 外国专利> METHOD OF MEASURING THE VOID RATIO OF FINE SOIL THROUGH X-RAY/CT, CAPABLE OF MEASURING THE VOID RATIO OF SOIL BY PERFORMING X-RAY/CT ON THE CENTRAL PART OF A SAMPLE

METHOD OF MEASURING THE VOID RATIO OF FINE SOIL THROUGH X-RAY/CT, CAPABLE OF MEASURING THE VOID RATIO OF SOIL BY PERFORMING X-RAY/CT ON THE CENTRAL PART OF A SAMPLE

机译:通过X射线/ CT测量细土空隙率的方法,能够通过在样品的中央进行X射线/ CT测量土壤的空隙率。

摘要

PURPOSE: A method of measuring the void ratio of fine soil through X-ray/CT is provided to enable the void ratio of soil to be easily measured using X-ray/CT even if it is impossible to visualize void through X-ray/CT images.;CONSTITUTION: A method of measuring the void ratio of fine soil through X-ray/CT is as follows. X-ray/CT is performed on a sample of standard soil to obtain images(S1). CT value is calculated on each voxel of the obtained X-ray/CT images(S2). A CT representative value for representing the area, on which X-ray/CT has been performed, is calculated from each CT value of a plurality of voxels arranged on that area(S3). The CT representative value and the void ratio of soil on the X-ray/CT images of taken soil using a corresponding X-ray/CT device are obtained. The obtaining of images, CT value and CT representative value by X-ray/CT on a plurality of kinds of standard soil sample with different void ratios is repeated to build database on CT representative value for the void ratios(S4).;COPYRIGHT KIPO 2011
机译:目的:提供一种通过X射线/ CT测量细土的孔隙率的方法,即使无法通过X射线/ CT可视化孔隙,也可以使用X射线/ CT轻松测量土壤的孔隙率。 CT图像。组成:一种通过X射线/ CT测量细土孔隙率的方法如下。在标准土壤样品上进行X射线/ CT扫描以获得图像(S1)。在获得的X射线/ CT图像的每个体素上计算CT值(S2)。根据布置在该区域上的多个体素的每个CT值,计算出用于表示执行了X射线/ CT的区域的CT代表值(S3)。使用相应的X射线/ CT装置获得的土壤X射线/ CT图像上的CT代表值和土壤的空隙率。重复通过X射线/ CT对多种不同孔隙率的标准土壤样品获取图像,CT值和CT代表值的方法,建立关于CT代表值的孔隙率数据库(S4)。 2011年

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