APPARATUS FOR MEASURING THE THICKNESS AND PRESSURE OF AN ION EXCHANGE MEMBRANE AND MEASURING METHOD THEREOF FOR COMPUTING ACCURATE IONIC CONDUCTANCE

摘要

PURPOSE: An apparatus for measuring the thickness and pressure of an ion exchange membrane and a measuring method thereof are provided to measure a thickness change occurred due to pressure applied to an ion exchange membrane. ;CONSTITUTION: An apparatus for measuring the thickness and pressure of an ion exchange membrane comprises electrode units(10), a guide unit(30), a measurement unit(40), a pressure applying unit(50), and a pressure sensing unit(60). The electrode units are arranged in the thickness direction of an ion exchange membrane. The guide unit comprises first and second guide units(32,34) which press both surfaces of the ion exchange membrane. The measurement unit is formed in one side of the first guide and measures the thickness change of the ion exchange membrane. The pressure applying unit is connected to the first guide and is moved when the first guide is reciprocated. The pressure sensing unit is in contact with the pressure applying unit and senses pressure applied to the ion exchange membrane.;COPYRIGHT KIPO 2011