首页> 外国专利> SELF FAILURE DIAGNOSTIC METHOD OF A MICRO CONTROLLER UNIT WHICH SUCCESSIVELY DIAGNOSES SELF FAILURE

SELF FAILURE DIAGNOSTIC METHOD OF A MICRO CONTROLLER UNIT WHICH SUCCESSIVELY DIAGNOSES SELF FAILURE

机译:成功诊断自失效的微控制器的自失效诊断方法

摘要

PURPOSE: A self failure diagnostic method of a micro controller unit is provided to eliminate the time delay created when communicating between units in order to diagnosis failure.;CONSTITUTION: A micro controller unit is initialized after being applied the power to the micro controller unit(S1). A micro controller unit comprises a plurality of registers, an internal algorithm, a RAM and a ROM. The micro controller unit determines whether the operation of the micro controller unit is normality or not through a self failure diagnostic program. The operation of the micro controller unit is controlled when one of the registers, the internal algorithm, the RAM and the ROM is malfunction.;COPYRIGHT KIPO 2011
机译:目的:提供一种微控制器单元的自故障诊断方法,以消除为了诊断故障而在单元之间进行通信时所产生的时间延迟;组成:微控制器单元在通电后会初始化S1)。微控制器单元包括多个寄存器,内部算法,RAM和ROM。微控制器单元通过自故障诊断程序确定微控制器单元的操作是否正常。当寄存器,内部算法,RAM和ROM之一发生故障时,控制微控制器单元的操作。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20110092011A

    专利类型

  • 公开/公告日2011-08-17

    原文格式PDF

  • 申请/专利权人 HYUNDAI MOBIS CO. LTD.;

    申请/专利号KR20100011419

  • 发明设计人 KIM YONG SUB;

    申请日2010-02-08

  • 分类号B60W50/02;B60W50/04;B60R16/023;

  • 国家 KR

  • 入库时间 2022-08-21 17:51:18

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