首页> 外国专利> PHASE CHANGING FILM FORMATION METHOD CAPABLE OF STABLY EMBEDDING A PHASE CHANGING FILM AND A PHASE CHANGE MEMORY DEVICE MANUFACTURING METHOD USING THE SAME

PHASE CHANGING FILM FORMATION METHOD CAPABLE OF STABLY EMBEDDING A PHASE CHANGING FILM AND A PHASE CHANGE MEMORY DEVICE MANUFACTURING METHOD USING THE SAME

机译:能够稳定地嵌入相变膜的相变膜形成方法和使用该相变膜的相变存储器制造方法

摘要

PURPOSE: A phase changing film formation method and a phase change memory device manufacturing method using the same are provided to suppress seam generation within a hole when embedding a phase changing film, thereby maintaining a constant composition ratio when performing three steps of a phase changing film formation process as deposition, etching, and deposition steps.;CONSTITUTION: A lower electrode is arranged. An interlayer insulating film including a hole on the lower electrode is arranged. A phase changing film(240) is arranged in order to embed the hole. An upper electrode(250) is arranged in the upper part of the phase changing film. The phase changing film is arranged by repeating a first deposition/etching process and second deposition process N times.;COPYRIGHT KIPO 2012
机译:用途:提供相变膜形成方法和使用该相变膜形成方法的相变存储器件制造方法,以在埋入相变膜时抑制孔内的接缝产生,从而在执行相变膜的三个步骤时保持恒定的组成比组成:沉积,蚀刻和沉积步骤。;组成:安排了一个下部电极。在下电极上布置包括孔的层间绝缘膜。布置相变膜(240)以便嵌入孔。在相变膜的上部布置有上电极(250)。相变膜通过重复第一次沉积/蚀刻过程和第二次沉积过程N次来布置。; COPYRIGHT KIPO 2012

著录项

  • 公开/公告号KR20110099201A

    专利类型

  • 公开/公告日2011-09-07

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20110074759

  • 发明设计人 KIM HYUN PHILL;RHO IL CHEOL;CHUNG JIE WON;

    申请日2011-07-27

  • 分类号H01L27/115;H01L21/8247;H01L21/20;

  • 国家 KR

  • 入库时间 2022-08-21 17:51:09

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