首页> 外国专利> LIQUID CRYSTAL X-RAY INSPECTION APPARATUS FOR THIN GLASS SUBSTRATES CAPABLE OF HAVING A HIGH DEFINITION DISPLAY BY OPTIMIZING THE THICKNESS OF A GLASS

LIQUID CRYSTAL X-RAY INSPECTION APPARATUS FOR THIN GLASS SUBSTRATES CAPABLE OF HAVING A HIGH DEFINITION DISPLAY BY OPTIMIZING THE THICKNESS OF A GLASS

机译:用于通过优化玻璃厚度实现高清晰度显示的薄玻璃基体的液晶X射线检查装置

摘要

PURPOSE: A liquid crystal X-ray inspection apparatus for thin glass substrates is provided to make a liquid crystal X-ray inspection apparatus without cracks by optimizing the thickness of a glass.;CONSTITUTION: A liquid crystal X-ray inspection apparatus for thin glass substrates comprises a liquid crystal X-ray test liquid crystal plate(100-2). The liquid crystal X-ray test liquid crystal plate comprises an upper glass substrate(111), an upper electrode(112), an optical conductive layer(113), and a reflector(114). The reflector, optical conductive layer and upper electrode are formed on the upper glass substrates. A lower electrode(122) and a lower alignment layer(125) are made in a lower glass substrates(121). The upper substrates and lower substrates are welded. A liquid crystal layer(130) is made between the upper substrates and lower substrates.;COPYRIGHT KIPO 2012
机译:目的:提供一种用于薄玻璃基板的液晶X射线检查设备,以通过优化玻璃的厚度使液晶X射线检查设备无裂纹;组成:薄玻璃液晶X射线检查设备基板包括液晶X射线测试液晶板(100-2)。液晶X射线测试液晶板包括上玻璃基板(111),上电极(112),光导层(113)和反射器(114)。反射器,光导层和上电极形成在上玻璃基板上。在下部玻璃基板(121)上形成下部电极(122)和下部取向层(125)。上基板和下基板被焊接。在上基板和下基板之间形成液晶层(130)。; COPYRIGHT KIPO 2012

著录项

  • 公开/公告号KR20110110898A

    专利类型

  • 公开/公告日2011-10-10

    原文格式PDF

  • 申请/专利权人 SESIM. LTD.;

    申请/专利号KR20100030182

  • 发明设计人 BAEK SAM HAK;

    申请日2010-04-02

  • 分类号G01N23/04;G01T1/16;G01T1/204;

  • 国家 KR

  • 入库时间 2022-08-21 17:50:57

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