首页> 外国专利> Uniform Etching Apparatus for Large Optical Systems Including Lightweight Processed Parts and Uniform Etching Method for Large Optical Systems

Uniform Etching Apparatus for Large Optical Systems Including Lightweight Processed Parts and Uniform Etching Method for Large Optical Systems

机译:大型光学系统的均匀蚀刻装置,包括轻量加工零件和大型光学系统的均匀蚀刻方法

摘要

PURPOSE: The uniform etching device and uniform etching method of a large optical system including a lightweight processing part are provided to uniformly etch the large optical system by generating turbulence to an etching solution based on a rotating rod combined with a turbulence generating unit. CONSTITUTION: The uniform etching device of a large optical system(10) includes a plurality of lightweight processing parts(100) equipped with opening parts and an internal spaces. The uniform etching device includes an etching solution inlet and an etching solution outlet. An etching solution is stored in an etching tank(210). The large optical system is emerged in the etching tank. A rotating rod(400), which is rotatable based on the longitudinal direction, is inserted into the lightweight processing part. A turbulence generating unit(410) is formed at the rotating rod and generates turbulence to the etching solution.
机译:目的:提供一种大型光学系统的均匀蚀刻装置和均匀蚀刻方法,该光学系统包括轻型处理部,以通过基于与湍流产生单元结合的旋转杆对蚀刻液产生湍流来均匀蚀刻大型光学系统。构成:大型光学系统(10)的均匀蚀刻设备包括多个轻巧的加工部件(100),该部件具有开口部分和内部空间。均匀蚀刻装置包括蚀刻溶液入口和蚀刻溶液出口。蚀刻溶液存储在蚀刻槽(210)中。大型光学系统出现在蚀刻槽中。能够基于长度方向旋转的旋转杆(400)插入轻量化处理部。湍流产生单元(410)形成在旋转杆上,并产生对蚀刻溶液的湍流。

著录项

  • 公开/公告号KR101047465B1

    专利类型

  • 公开/公告日2011-07-07

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20090095952

  • 发明设计人 이혁교;이현수;양호순;이윤우;

    申请日2009-10-09

  • 分类号C03C15;G02B3;

  • 国家 KR

  • 入库时间 2022-08-21 17:50:05

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