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The development equipment of auto trimmibg defect machine vision and using methods of semiconductor IC

机译:自动修整缺陷机器视觉的开发设备及半导体IC的使用方法

摘要

As information and communication develops, communication systems must develop accordingly, and the trend toward miniaturization and lightening of the system is increasing. The present invention is an equipment that checks and classifies defects by automatically inspecting the surface and trimming state of semiconductors and automatically detecting the defects in Machine Vision. The inspection items of Trimming are Lead Pitch, Mold Burr, Lead Damage, Gate Burr, Dambar Broken, Dambar Broken, Dambar Uncut;Dambar Burr, Nick, Mold Burr, Lead Damage, Gate Burr, etc. The semiconductor surface and the Trimming inspection result window were invented to display the number of errors for the Trimming inspection item, and to display the total number of good and defective items, the total number of inspections, and the number of quality satisfaction. The object of the present invention is to automatically inspect the trimming state of semiconductors and to inspect the quality in real time in the manufacturing line, thereby contributing to the identification of the cause of the defect rate and improving the quality and improving the productivity. And an inspection algorithm and a system for classifying defects. This system consists of one line scan CCD camera for inspection of trimming state of semiconductor, frame grabber, computer and lighting equipment for image processing, one area scan CCD camera for frame inspection, frame grabber, It consists of hardware and software such as computer and lighting equipment for image processing. Firstly, it is a device that captures the image of the object, and the image data is transferred to the computer's memory through the image frame grabber. CCD camera consists of camera body, signal cable and lens. It is a device that receives the image data stored in the CCD camera, and is in charge of driving and interface of the CCD camera. The frame grabber used in this system consists of three parts: camera interface, image memory and PCI bus interface. The instrument part consists of a transport mechanism to smooth the part and transport it onto the correct inspection system, an optical mechanism for the optimal inspection environment, and a housing for light control. And an optical filter. The control panel is a PLC and other electrical and electronic systems that provide outputs to the motion controller, proximity sensor, lighting controller, host computer and peripheral equipment for driving inspection programs, and reports on defective parts. The inspection software runs on Windows XP's O / S on the main computer, which controls peripherals, performs inspections, sets inspection items and parameters, as well as stores images of the IC's trimming status. Play a role.; Trimming Inspection System of Semiconductor IC, Semiconductor Component Inspection Equipment, LCD Component Inspection Equipment, Electrical Component Inspection Equipment, Electronic Component Inspection Equipment, Mechanical Component Inspection Equipment.
机译:随着信息和通信的发展,通信系统必须相应地发展,并且系统的小型化和轻量化的趋势正在增加。本发明是一种通过自动检查半导体的表面和修整状态并自动检测机器视觉中的缺陷来检查和分类缺陷的设备。修整的检查项目有:引线间距,铸模毛刺,引线损坏,门毛刺,Dambar破损,Dambar破碎,Dambar未切割; Dambar毛刺,尼克,铸模毛刺,引线损坏,门毛刺等。半导体表面和修整检查发明了结果窗口,以显示修整检查项目的错误数量,并显示良品和次品的总数,检查总数和质量满意度。本发明的目的是自动检查半导体的修整状态并在生产线中实时检查质量,从而有助于识别缺陷率的原因并改善质量并提高生产率。以及用于分类缺陷的检查算法和系统。该系统由用于检查半导体的微调状态的行扫描CCD摄像机,图像采集卡,计算机和用于图像处理的照明设备,用于图像检查的面扫描CCD相机,图像采集卡组成,它包括计算机和用于图像处理的照明设备。首先,它是一种捕获对象图像的设备,并且图像数据通过图像帧抓取器传输到计算机的内存中。 CCD摄像机由摄像机主体,信号线和镜头组成。它是一种设备,用于接收存储在CCD照相机中的图像数据,并负责CCD照相机的驱动和接口。该系统中使用的抓帧器包括三个部分:相机接口,图像存储器和PCI总线接口。仪器零件包括使零件光滑并输送到正确的检查系统上的输送机构,用于最佳检查环境的光学机构以及用于光控制的外壳。和一个光学滤镜。控制面板是PLC和其他电气和电子系统,可向运动控制器,接近传感器,照明控制器,主计算机和外围设备提供输出,以驱动检查程序,并报告缺陷零件。该检查软件在主计算机上Windows XP的O / S上运行,该计算机控制外围设备,执行检查,设置检查项目和参数以及存储IC的修整状态图像。扮演一个角色。;半导体集成电路修整检查系统,半导体元件检查设备,LCD元件检查设备,电气元件检查设备,电子元件检查设备,机械元件检查设备。

著录项

  • 公开/公告号KR20110001460U

    专利类型

  • 公开/公告日2011-02-11

    原文格式PDF

  • 申请/专利权人 김교월;

    申请/专利号KR20090010204U

  • 发明设计人 김교월;

    申请日2009-08-05

  • 分类号G01N21/88;G01B11/30;G01R31/26;

  • 国家 KR

  • 入库时间 2022-08-21 17:49:20

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