首页> 外国专利> Evaluation device, the measuring arrangement and method for the path length measurement, as well as the measuring arrangement and method for a coordinate measuring machine and coordinate measuring machine

Evaluation device, the measuring arrangement and method for the path length measurement, as well as the measuring arrangement and method for a coordinate measuring machine and coordinate measuring machine

机译:评估装置,用于行程长度测量的测量装置和方法,以及用于坐标测量机和坐标测量机的测量装置和方法

摘要

An evaluation device (51) for a path length measurement is set up, in order to evaluate a measuring signal (15) of an intensity of a sequence of pulses of electromagnetic radiation, in particular a sequence of light pulses, after passing through of a measurement path length (12, 13) as a function of time represents. The sequence of pulses is of a radiation source, in particular a light source (2), with a repetition rate is generated. The evaluation device (51) is arranged around a first component (73) of the measuring signal (15), which oscillates with a first frequency, and a second component (75) of the measuring signal (15), which oscillates with a second frequency, which is greater than the first frequency, to evaluate. The first frequency, the repetition rate or a multiple of the repetition rate correspond to. The second frequency can correspond to a further multiple of the repetition rate.
机译:设置用于路径长度测量的评估装置(51),以便在通过电磁辐射之后评估电磁辐射脉冲序列,特别是光脉冲序列的强度的测量信号(15)。测量路径长度(12、13)随时间变化。脉冲序列是辐射源,特别是光源(2),其具有重复率。评估装置(51)布置在以第一频率振荡的测量信号(15)的第一分量(73)和以第二频率振荡的测量信号(15)的第二分量(75)的周围。大于第一个频率的频率进行评估。第一频率,重复率或重复率的倍数对应。第二频率可以对应于重复率的另外的倍数。

著录项

  • 公开/公告号DE102009024464A1

    专利类型

  • 公开/公告日2010-12-16

    原文格式PDF

  • 申请/专利权人

    申请/专利号DE20091024464

  • 发明设计人

    申请日2009-06-10

  • 分类号G01S17/10;G01S17/32;G01B21/04;G01B11/14;G01B5/008;

  • 国家 DE

  • 入库时间 2022-08-21 17:47:52

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