Method for measuring magnetic information, in particular the magnetic AC susceptibility, of magnetic nanoparticles (markers)

摘要

The invention relates to a method for measuring magnetic information, in particular magnetic AC susceptibility, the measured signal being processed further by means of an amplifier, of nanoparticles (markers) which are introduced into / onto a sample or are contained in a sample which intensify or weaken an external magnetic flux density, the invention being characterized in that the markers are excited by an alternating magnetic field H and thereby produce a magnetic flux density which is dependent on the AC susceptibility of the markers and the alternating field H and which changed the total flux density B in the vicinity of the markers, the sample to be examined is scanned in two or three dimensions and the change in the total magnetic flux density B locally by means of the oscillation of the atomic force microscope (AFM) tip excited by the magnetic interaction using an atomic force microscope is measured (sign al).