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Submicron particulate filter leakage examining method, involves gathering statement whether filter is leakage-freebased on value of quotient such that particle size corresponds to particle size with Most Penetrating Particle Size
Submicron particulate filter leakage examining method, involves gathering statement whether filter is leakage-freebased on value of quotient such that particle size corresponds to particle size with Most Penetrating Particle Size
The method involves clamping a submicron particulate air filter (10) which is to be examined. A quotient is formed from two passage values of two particle sizes of the filter using a computer program. A statement is gathered whether the filter is leakage-free or leakage afflicted based on the value of the quotient in such a manner that one of the particle size corresponds to particle size with the Most Penetrating Particle Size (MPPS) and other particle size is the sum value from the MPPS value and an addition value, which amounts to 100 Nm. An independent claim is also included for a data carrier with a computer program for performing a method for leakage examination of a submicron particulate filter.
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