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base plate for use in the massenspektrometrieanalyse and method and device for massenspektrometrieanalyse

机译:用于质量计量分析的基板以及用于质量计量分析的方法和装置

摘要

PROBLEM TO BE SOLVED: To use a low-power laser beam in a method for desorbing substances fixed to the surface of a substrate from the surface by the irradiation of a laser beam, acquiring the substances, and performing mass spectrometry.;SOLUTION: As a substrate for mass spectrometry used in the method for desorbing substances fixed to the surface of a substrate from the surface by the irradiation of a laser beam, acquiring their ions, and performing mass spectrometry, a substrate 3 having a metal roughened surface capable of exciting localized plasmon by being irradiated with a laser beam (for example, small gold particles 8 are filled in a large number of micropores 6 formed in the surface of an alumina layer 5 in such a way that their top parts each larger than the diameter of the micropore 6 may protrude more upward than the surface of the alumina layer 5) at least in part of its surface is used.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:在通过激光束的照射使固定在基板表面的物质从表面解吸,获取该物质并进行质谱分析的方法中,使用低功率激光束。在通过激光束的照射使固定在基板表面上的物质从表面脱附,获取其离子并进行质谱分析的方法中使用的用于质谱的基板,具有能够激发金属粗糙表面的基板3通过用激光束照射局部等离激元(例如,将小的金颗粒8填充到在氧化铝层5的表面中形成的大量微孔6中,使得它们的顶部各自大于直径的直径)。微孔6可能比氧化铝层5的表面更向上突出)至少在其部分表面被使用。;版权所有:(C)2007,JPO&INPIT

著录项

  • 公开/公告号DE602006021689D1

    专利类型

  • 公开/公告日2011-06-16

    原文格式PDF

  • 申请/专利权人 FUJIFILM CORP.;

    申请/专利号DE20066021689T

  • 发明设计人 NAYA MASAYUKI;OHTSUKA HISASHI;

    申请日2006-12-21

  • 分类号C12Q1/68;G01N21/65;G01N27/62;G01N27/64;G01N30/72;H01J49/04;

  • 国家 DE

  • 入库时间 2022-08-21 17:46:27

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