首页> 外国专利> METHOD AND DEVICE FOR MEASURING TEMPERATURES, ESPECIALLY CRYOGENIC TEMPERATURES, USING SEMICONDUCTOR NANOCRYSTALS

METHOD AND DEVICE FOR MEASURING TEMPERATURES, ESPECIALLY CRYOGENIC TEMPERATURES, USING SEMICONDUCTOR NANOCRYSTALS

机译:使用半导体纳米材料测量温度,尤其是低温温度的方法和装置

摘要

Method and device for measuring temperatures, especially cryogenic temperatures, using semiconductor nanocrystals To measure the temperature of an object (20), a sensor (24) having semiconductor nanocrystals is used, the nanocrystals are brought into thermal contact with the object and the nanocrystals are irradiated with a light (26) such that they emit fluorescence radiation (28). According to the invention, the decay time of the radiation is determined and the temperature is determined from this time.
机译:使用半导体纳米晶体测量温度,尤其是低温温度的方法和装置为了测量物体(20)的温度,使用具有半导体纳米晶体的传感器(24),使纳米晶体与物体热接触并且使纳米晶体与物体接触。用光(26)照射,使它们发出荧光辐射(28)。根据本发明,确定辐射的衰减时间并且从该时间确定温度。

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