首页> 外国专利> IMPACT TESTING APPARATUS WITH DOUBLE HAMMERING PREVENTION MECHANISM AND DOUBLE HAMMERING PREVENTION METHOD FOR IMPACT TESTING APPARATUS

IMPACT TESTING APPARATUS WITH DOUBLE HAMMERING PREVENTION MECHANISM AND DOUBLE HAMMERING PREVENTION METHOD FOR IMPACT TESTING APPARATUS

机译:具有双重锤击预防机制的冲击试验装置和双重锤击预防方法

摘要

PROBLEM TO BE SOLVED: To provide an impact testing apparatus comprising a mechanism for preventing an object to be measured from being brought into contact with a hammer again after excitation.;SOLUTION: An impact testing apparatus includes a plate for fixing an object to be measured on the upper surface thereof and a hammer for striking a lower surface of the plate. In the impact testing apparatus, when the hammer strikes the plate, the plate moves up, reaches a top dead point and then falls down by free fall. The impact testing apparatus further includes restriction means for restricting the fall of the plate.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:提供一种冲击试验装置,该冲击试验装置包括用于防止激励后被测物再次与锤子接触的机构。在其上表面上有一个锤子,用来敲击板的下表面。在冲击测试设备中,当锤子撞击板子时,板子向上移动,到达最高死点,然后由于自由落体而掉落。冲击试验装置还包括用于限制板下落的限制装置。版权所有:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP2012193969A

    专利类型

  • 公开/公告日2012-10-11

    原文格式PDF

  • 申请/专利权人 NEC CORP;

    申请/专利号JP20110056214

  • 发明设计人 SUGANO YUUTAI;

    申请日2011-03-15

  • 分类号G01M7/08;

  • 国家 JP

  • 入库时间 2022-08-21 17:44:57

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