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METHOD AND DEVICE FOR MEASURING DISTRIBUTION OF SPECULAR REFLECTION LIGHT

机译:测量反射光分布的方法和装置

摘要

PROBLEM TO BE SOLVED: To provide a method and device for measuring the distribution of specular reflection light, capable of measuring the distribution and evaluating unevenness in brightness on a sample surface.;SOLUTION: A method for measuring the distribution of specular reflection light includes the steps of allowing illumination light to enter a sample, and measuring the sample surface through a tilted optical system. The angle of the optical axis of the incident illumination light on the sample and the angle of the optical axis for measuring the sample surface have a mirror reflection relation relative to the normal of the sample.;COPYRIGHT: (C)2012,JPO&INPIT
机译:解决的问题:提供一种用于测量镜面反射光的分布的方法和装置,该方法和装置能够测量样品表面的亮度分布和评估亮度不均匀性。解决方案:一种用于测量镜面反射光的分布的方法包括:步骤,允许照明光进入样品,并通过倾斜的光学系统测量样品表面。样品上入射照明光的光轴角度和样品表面测量光轴的角度相对于样品法线成镜面反射关系。版权所有:(C)2012,JPO&INPIT

著录项

  • 公开/公告号JP2012184933A

    专利类型

  • 公开/公告日2012-09-27

    原文格式PDF

  • 申请/专利权人 MITSUBISHI PAPER MILLS LTD;

    申请/专利号JP20110046283

  • 发明设计人 INOUE SHINICHI;

    申请日2011-03-03

  • 分类号G01N21/55;

  • 国家 JP

  • 入库时间 2022-08-21 17:43:53

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