BURN-IN DEVICE, BURN-IN SYSTEM, CONTROL METHOD OF BURN-IN DEVICE, AND CONTROL METHOD OF BURN-IN SYSTEM

摘要

PROBLEM TO BE SOLVED: To exclude an arbitrary device to be tested from test objects by a simple configuration.;SOLUTION: A burn-in device to which a burn-in board provided with a plurality of devices to be tested is inserted to perform burn-in tests for the plurality of devices to be tested includes: a device select signal output circuit for outputting a device select signal for selecting a device to be tested about a function test from the plurality of devices to be tested to the burn-in board; and a test pattern output circuit for outputting test pattern data to be supplied to the device to be tested about the function test to the burn-in board. The device select signal output circuit includes a mask setting memory in which mask setting data are stored and masks the device select signal so that a device to be tested specified by the mask setting data is not selected as a device to be tested about the function test.;COPYRIGHT: (C)2012,JPO&INPIT