METHOD AND APPARATUS FOR MEASURING REFLECTION LOSS OF SUBMILLIMETER WAVE

摘要

PROBLEM TO BE SOLVED: To provide an apparatus and a method for measuring reflection characteristics (reflection loss and reflectivity) of a submillimeter wave of a metal material sample with high accuracy.;SOLUTION: The apparatus and the method include: measuring the intensities of submillimeter waves of radiation light generated from each of two heat radiators having different temperatures, which are different when the radiation light travels through a reference route and when the radiation light travels through a route to be measured accompanied by reflection due to a metal material sample; and calculating reflection characteristics of the sample using the measured result.;COPYRIGHT: (C)2012,JPO&INPIT