首页> 外国专利> DISPLACEMENT CALCULATION METHOD, CORRECTION METHOD OF DRAWING DATA, DRAWING METHOD, AND DRAWING DEVICE

DISPLACEMENT CALCULATION METHOD, CORRECTION METHOD OF DRAWING DATA, DRAWING METHOD, AND DRAWING DEVICE

机译:位移计算方法,绘制数据的校正方法,绘制方法和绘制设备

摘要

PROBLEM TO BE SOLVED: To provide a displacement calculation method, along with a drawing device, capable of accurately calculating displacement by understanding the tendency of distortion over a wide area of a substrate even if a distortion which is not local occurs on the substrate.;SOLUTION: A deviation amount ΔX in X direction is calculated at each position of alignment marks M11-M14, M21-M24, M31-M34, and M41-M44. Based on the deviation amount, a first spline curve SL1 is drawn, to calculate correction values ΔX1-ΔX4 at X position (X=xe) of an evaluation point E(xe, ye). A first sub-spline curve SL1S is drawn based on the ΔX1-ΔX4, to calculate a correction value ΔXe at Y position (X=ye) of the evaluation point E(xe, ye), which is used as a correction amount in X direction. The correction amount in Y direction can be calculated likewise.;COPYRIGHT: (C)2012,JPO&INPIT
机译:解决的问题:提供一种位移计算方法以及绘图装置,即使在基板上发生非局部变形的情况下,也能够通过了解基板的大面积的变形趋势来准确地计算位移。解决方案:在对准标记M11-M14,M21-M24,M31-M34和M41-M44的每个位置计算X方向的偏差量ΔX。基于该偏差量,绘制第一样条曲线SL1,以计算评估点E(xe,ye)的X位置(X = xe)处的校正值ΔX1-ΔX4。基于ΔX1-ΔX4绘制第一子样条曲线SL1S,以计算评估点E(xe,ye)的Y位置(X = ye)处的校正值ΔXe,使用该修正值ΔXe。作为X方向的校正量。同样可以计算出Y方向上的校正量。;版权:(C)2012,JPO&INPIT

著录项

  • 公开/公告号JP2012079739A

    专利类型

  • 公开/公告日2012-04-19

    原文格式PDF

  • 申请/专利权人 DAINIPPON SCREEN MFG CO LTD;

    申请/专利号JP20100220717

  • 发明设计人 YAMADA AKIRA;YASAKA SATOSHI;

    申请日2010-09-30

  • 分类号H01L21/027;

  • 国家 JP

  • 入库时间 2022-08-21 17:41:52

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