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MEASUREMENT METHOD AND MEASUREMENT MARKS FOR PATTERN SHIFT AMOUNT BETWEEN EXPOSURE REGIONS

机译:曝光区域之间图案偏移量的测量方法和测量标记

摘要

PROBLEM TO BE SOLVED: To provide a measurement method and measurement marks for a pattern shift amount between exposure regions, which allow a speedy and real-time measurement and improvement in the failure detection rate and yield for the pattern shift amount between the exposure regions.;SOLUTION: The method includes: a step of forming at least one pair of conductive measurement marks having a predetermined positional relation by two exposure and other patterning processes; and a step where an electrical characteristic examination is performed for at least one pair of the conductive measurement marks and if the electrical characteristic does not correspond to the predetermined positional relation, the exposure pattern shift amount between the exposure regions in two exposure processes is determined to fail and if the electrical characteristic corresponds to the predetermined positional relation, the exposure pattern shift amount between the exposure regions in two exposure processes is determined to pass. The present invention applies to the measurement of the pattern shift amount between the exposure regions.;COPYRIGHT: (C)2012,JPO&INPIT
机译:解决的问题:提供用于曝光区域之间的图案偏移量的测量方法和测量标记,其允许快速且实时地测量,并且提高了故障检测率和曝光区域之间的图案偏移量的合格率。解决方案:该方法包括:通过两次曝光和其他构图工艺形成至少一对具有预定位置关系的导电测量标记的步骤;对至少一对导电测量标记进行电特性检查,并且如果电特性不符合预定的位置关系,则确定两次曝光过程中曝光区域之间的曝光图案偏移量为:如果电特性不符合预定的位置关系,则确定两个曝光过程中的曝光区域之间的曝光图案偏移量合格。本发明适用于曝光区域之间的图案偏移量的测量。版权所有:(C)2012,JPO&INPIT

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