首页> 外国专利> Dual stress (duplex stress) being production manner of the SOI substrate and the manner which

Dual stress (duplex stress) being production manner of the SOI substrate and the manner which

机译:作为SOI衬底的制造方式的双重应力(双重应力)及其制造方法

摘要

Topic This invention in the nFET territory of structure, tensile stress is applied, the double stress Si structure which applies compressed stress on the pFET territory of structure is offered.SolutionsSpeaking roughly, double stress Si structure, on the baseplate and the baseplate has 1st semiconductor layer with respect to compressibility dielectric layer and compressibility dielectric layer, at 1st lamination stack on baseplate, compressibility dielectric layer in 1st semiconductor layer, tensile stress is transmitted, in regard to the aforementioned 1st lamination stack and the baseplate it pulls and possesses 2nd semiconductor layer with respect to characteristic dielectric layer and pulling characteristic dielectric layer, it pulls at 2nd lamination stack on baseplate, and characteristic dielectric layer transmits compressed stress to 2nd semiconductor layer, the aforementioned 2nd laminationIt possesses with stack. As for pulling characteristic dielectric layer and compressibility dielectric layer it is desirable to possess the nitride of Si3 N4 and the like. Selective figure Figure 1
机译:本发明在结构的nFET区域中施加拉应力,提供了在结构的pFET区域上施加压缩应力的双应力Si结构。解决方案粗略地说,在基板上的双应力Si结构具有相对于可压缩介电层和可压缩介电层的第一半导体层,在基板上的第一叠层堆叠中,在第一半导体层中的可压缩介电层,拉伸应力被传递,关于上述第一叠层堆叠和其被拉动并拥有的基板相对于特征介电层和拉动特征介电层的半导体层,在基板上的第二叠层堆叠上拉动,并且特征介电层将压缩应力传递至第二半导体层,上述第二叠层具有堆叠。对于拉伸特性电介质层和可压缩性电介质层,希望具有Si 3 N 4 等的氮化物。<选择图>图1

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号