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Nondestructive inspection apparatus and nondestructive inspection for scanning device

机译:扫描装置的无损检查装置及无损检查

摘要

Corresponding to the size and shape of the structure to be inspected, and non-destructive inspection device and nondestructive inspection scanning apparatus capable of attachment to structures and is easy to achieve cost reduction and miniaturization I provide. NDT scanning device is moved relative to inspection surface of the inspection object (P) A (2), the probe used for detecting defects in the inspection object (P), (3), the inspection object ( annular groove which sandwich the inner guide portion (27) on the circumferential surface in contact guide portion of the rod-shaped and is located in P), extending along the surface inspected in the (P) and (27), the inspection object (P) and holds the suction part for generating a suction force for pressing the (P) inspected a pair of wheels with (23F) and (23), wheel (23) and (23), the probe (3), a pair of about the rotation axis extending in a direction intersecting the surface inspected (23) is in contact with wheels (P), a housing mounted pivotably (23) a pair of wheels, and (21) is provided have.
机译:本发明提供与被检查结构的尺寸和形状相对应的,能够安装在结构上且容易实现成本降低和小型化的无损检查装置和无损检查扫描装置。 NDT扫描装置相对于检查对象(P)A的检查表面移动(2),用于检测检查对象(P)中的缺陷的探针(3),检查对象(将内部导轨夹在中间的环形凹槽)棒状的接触引导部分的圆周表面上的部分(27),位于P)中,并沿着检查对象(P)和(27)中检查的表面延伸,并保持吸气部分为了产生用于按压(P)的吸引力,检查了具有(23F)和(23)的一对轮子,轮子(23)和(23),探针(3),一对围绕旋转轴线延伸的轮子。沿与被检查表面(23)相交的方向与轮子(P)接触,设有可枢转地安装(23)一对轮子的壳体(21)。

著录项

  • 公开/公告号JP4961051B2

    专利类型

  • 公开/公告日2012-06-27

    原文格式PDF

  • 申请/专利权人 一般財団法人電力中央研究所;

    申请/专利号JP20110513182

  • 发明设计人 福冨 広幸;林 山;

    申请日2010-05-28

  • 分类号G01N29/26;

  • 国家 JP

  • 入库时间 2022-08-21 17:38:22

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