The substrate evaluation device, substrate evaluation method, being the substrate evaluation device which evaluates the good or bad of the design of the record media null

摘要

PROBLEM TO BE SOLVED: To provide a substrate evaluation device for correctly calculating the return path of a signal line.;SOLUTION: The substrate evaluating device 10 is provided with an input part 1, a layout preparing part 2, a storage part 3, a layout evaluating part 4, and an output part 5. The layout evaluating part 4 comprises a wiring determining part 4a for determining an evaluation wiring from among wirings included in a designed substrate; a plane-extracting part 4b for extracting a return plane having the possibility that the return path passes; a node-extracting part 4c for extracting a signal node representing the shape characteristics of an evaluation wiring; a candidate-extracting part 4d for extracting one or a plurality of return node candidates. having the possibility that the return path passes about each signal node; a path-extracting part 4e for extracting the shortest path from among the paths which connect the respective return node candidates as a return path; and a determining part 4f for determining the quality of a substrate design, on the basis of the shape of the return path and the shape of the evaluation wiring.;COPYRIGHT: (C)2009,JPO&INPIT