Reliability test substrate unit, reliability test equipment and reliability test method

摘要

PROBLEM TO BE SOLVED: To provide a substrate unit for reliability test capable of testing the reliability of a plurality of array light sources, at low cost.;SOLUTION: The substrate unit for reliability test having three input terminals (Ta-Tc) supplies drive current from the input terminal Ta to a surface-emitting laser 103a_1, a surface-emitting type laser 103b_1, and a surface-emitting laser 103c_3; supplies a drive current from the input terminal Tb for a surface-emitting laser 103a_2, a surface-emitting laser 103b_2, and a surface-emitting laser 103c_2; and supplies drive current from the input terminal Tc to a surface-emitting laser 103a_3, a surface-emitting laser 103b_3, and a surface-emitting laser 103c_1.;COPYRIGHT: (C)2008,JPO&INPIT