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The method of calculating the quality of the suffering test device, the program and the memory medium which remembers that

机译:痛苦测试设备的质量计算方法,程序和记忆介质

摘要

Being the method of calculating the quality of DUT making use of the test result which shows the good or bad of DUT at least in the matrix where plotting which in order to test DUT is stipulated with combination of 1st and 2nd test parameter is arranged into 2 dimensions, the test result of the plotting opposite where it consists of plotting the next door (a) in the matrix, the step which specifies at least and, (b) step (a) with adjoins 1 plotting opposite which shows the test result which differs to both plotting of the plotting opposite which specifies, consists of plotting the next door the step which specifies and, (c) step (It consists of plotting the next door in the territory where the plotting opposite which specifies a) and (b) in is included, it adjoins to both plotting of the plotting opposite which is selected the step which selects the plotting opposite which specifies and, (d) step (c) in the test result which differs the test result of the plotting opposite which consists of plotting the next door it includes with the step which specifies.
机译:作为利用测试结果计算DUT质量的方法,该测试结果至少在矩阵中显示了DUT的好坏,在矩阵中将要测试DUT的绘图与第一和第二测试参数的组合规定为2尺寸,相对绘图的测试结果,其中包括在矩阵中绘制下一扇门(a),至少指定该步骤的步骤,以及(b)相邻的步骤(a)1相对绘制的测试结果,其中不同于指定的相对绘图的绘图,包括指定步骤的邻门绘图,以及(c)步骤(其包括指定a)和(b)相对绘图的区域中的邻门绘图。在包括在内的同时,它与选择的绘图相对的图的选择步骤相邻,选择指定的绘图相对的步骤,以及(d)步骤(c)在测试结果中使不同的绘图的测试结果不同。在指定的步骤中包括绘制下一扇门。

著录项

  • 公开/公告号JPWO2010082330A1

    专利类型

  • 公开/公告日2012-06-28

    原文格式PDF

  • 申请/专利权人 株式会社アドバンテスト;

    申请/专利号JP20100501306

  • 发明设计人 結城 潤一;

    申请日2009-01-15

  • 分类号G01R31/28;G01R31/30;

  • 国家 JP

  • 入库时间 2022-08-21 17:36:33

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