Electronic parts handling equipment, electronic component test equipment, and methods of testing electronic components

摘要

The test tray (TST) when plural IC are loaded, the test head (5) making particular IC the contact section contact electrically, being the electronic part test equipment which is used in order to test IC electric quality, the test tray which loads plural IC (TST), before the testing the oscillating member which it turns to the direction which falls IC where at least one time, accommodation is insufficient (113) it has.