首页> 外国专利> PARASITIC PNP BIPOLAR TRANSISTOR IN A SILICON-GERMANIUM BICMOS PROCESS

PARASITIC PNP BIPOLAR TRANSISTOR IN A SILICON-GERMANIUM BICMOS PROCESS

机译:硅锗双CMOS工艺中的寄生PNP双极晶体管

摘要

A parasitic PNP bipolar transistor, wherein a base region includes a first and a second region; the first region is formed in an active area, has a depth larger than shallow trench field oxides, and has its bottom laterally extended into the bottom of the shallow trench field oxides on both sides of an active area; the second region is formed in an upper part of the first region and has a higher doping concentration; an N-type and a P-type pseudo buried layer is respectively formed at the bottom of the shallow trench field oxides; a deep hole contact is formed on top of the N-type pseudo buried layer to pick up the base; the P-type pseudo buried layer forms a collector region separated from the active area by a lateral distance; an emitter region is formed by a P-type SiGe epitaxial layer formed on top of the active area.
机译:一种寄生PNP双极晶体管,其中基极区包括第一和第二区;第一区域形成在有源区中,其深度大于浅沟槽场氧化物的深度,并且其底部横向延伸到有源区两侧的浅沟槽场氧化物的底部。第二区域形成在第一区域的上部并且具有较高的掺杂浓度。在浅沟槽场氧化物的底部分别形成N型和P型伪埋层。在N型伪埋层的顶部上形成深孔接触以拾取基极。 P型伪掩埋层形成与有源区隔开横向距离的集电极区。发射极区由形成在有源区顶部的P型SiGe外延层形成。

著录项

  • 公开/公告号US2012061793A1

    专利类型

  • 公开/公告日2012-03-15

    原文格式PDF

  • 申请/专利权人 DONGHUA LIU;WENSHENG QIAN;

    申请/专利号US201113228305

  • 发明设计人 WENSHENG QIAN;DONGHUA LIU;

    申请日2011-09-08

  • 分类号H01L29/06;

  • 国家 US

  • 入库时间 2022-08-21 17:33:49

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