首页> 外国专利> METHODS AND SYSTEMS FOR QUANTIFYING DEGRADATION OF WIRING INSULATION

METHODS AND SYSTEMS FOR QUANTIFYING DEGRADATION OF WIRING INSULATION

机译:量化电线绝缘层退化的方法和系统

摘要

A system for the measurement of degradation of electrical wire insulation quality is described. The system includes a clamping device for engaging the electrical wire to be tested for insulation degradation, the clamping device comprising a channel formed therein for placement of the electrical wire, a plurality of plates placed proximate the channel, the plates electrically connected to generate a capacitance and placed proximate the channel such that the wire insulation provides a portion of a dielectric for the generated capacitance, and a measurement device operatively attached to the plurality of plates such that the measurement device is configured to indicate an amount of degradation associated with the wire insulation based on at least one of the measured capacitance and dissipation factor.
机译:描述了一种用于测量电线绝缘质量的劣化的系统。该系统包括用于接合待测试的电线以进行绝缘劣化的夹持装置,该夹持装置包括在其中形成的用于放置电线的通道,靠近该通道放置的多个板,这些板电连接以产生电容并放置在通道附近,以使导线绝缘为产生的电容提供一部分电介质,以及可操作地连接到多个板上的测量装置,以使该测量装置配置为指示与导线绝缘相关的劣化量基于测得的电容和损耗因子中的至少一项。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号