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Capsule Polishing Device and Method For Capsule Polishing

机译:胶囊抛光装置及胶囊抛光方法

摘要

Various embodiments of a capsule polishing device include a resistive-heating element including an electrically resistive, superelastic wire forming a loop between first and second ends of the superelastic wire. The first and second ends of the loop may at least partially extend from a planar face defined by the loop, to an insulating portion. In some embodiments, the capsule polishing device may be configured to perform active capsule polishing through a combination of hyperthermia of LECs and mechanical abrasion of the capsule surface. In some embodiments, at least a side and end portion of the loop of the capsule polishing device may be shaped to follow a contour of the capsule bag. The loop may be heated to approximately 40 to 47 degrees Celsius to destroy LECs (other temperatures are also possible). In some embodiments, the loop may include a roughened surface to increase mechanical abrasion.
机译:胶囊抛光装置的各种实施例包括电阻加热元件,该电阻加热元件包括在超弹性线的第一端和第二端之间形成环的电阻性超弹性线。回路的第一端和第二端可以至少部分地从由回路限定的平面延伸到绝缘部分。在一些实施例中,胶囊抛光装置可以被配置为通过LEC的高温和胶囊表面的机械磨损的组合来执行主动胶囊抛光。在一些实施例中,胶囊抛光装置的环的至少一侧和端部可被成形为遵循胶囊袋的轮廓。可以将回路加热到大约40到47摄氏度,以破坏LEC(其他温度也是可能的)。在一些实施例中,环可包括粗糙的表面以增加机械磨损。

著录项

  • 公开/公告号US2011282335A1

    专利类型

  • 公开/公告日2011-11-17

    原文格式PDF

  • 申请/专利权人 GUANGYAO JIA;GLENN R. SUSSMAN;

    申请/专利号US20100777820

  • 发明设计人 GLENN R. SUSSMAN;GUANGYAO JIA;

    申请日2010-05-11

  • 分类号A61B18/04;

  • 国家 US

  • 入库时间 2022-08-21 17:30:44

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