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SYSTEM FOR CALIBRATING A TIME CONSTANT OF AN INTEGRATED CIRCUIT, AND INTEGRATED CIRCUIT PROVIDED WITH SUCH A SYSTEM

机译：用于校准集成电路的时间常数的系统以及由该系统提供的集成电路

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摘要

System and method for calibrating a time constant R0Ci of an integrated electronic current-feedback continuous-time delta sigma analog/digital converter (modulator) having a variable-impedance filter coupled to the input of the modulator, an analog input signal Vin of fixed frequency applied to the variable-impedance filter, wherein the analog input signal Vin attenuation engendered by the variable-impedance filter is measured, and the value of a time constant R0Ci in the modulator and the value of the impedance of the variable-impedance filter are modified until an attenuation corresponding to the desired attenuation for the integrated electronic circuit modulator is obtained.

机译：用于校准具有耦合到调制器的输入的可变阻抗滤波器的集成电子电流反馈连续时间delta sigma模拟/数字转换器（调制器）的时间常数R 0 Ci的系统和方法，将固定频率的模拟输入信号Vin施加到可变阻抗滤波器，其中测量由可变阻抗滤波器引起的模拟输入信号Vin衰减，并且时间常数R 0 修改调制器中的Ci和可变阻抗滤波器的阻抗值，直到获得与集成电路电子调制器所需的衰减相对应的衰减为止。 展开▼

著录项

公开/公告号US2012026024A1

专利类型

公开/公告日2012-02-02

原文格式PDF

申请/专利权人 ERIC ANDRE;SÉBASTIEN LEFEBVRE;JONATHAN AMIACH;
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申请/专利号US201013146898

发明设计人 ERIC ANDRE;SÉBASTIEN LEFEBVRE;JONATHAN AMIACH;
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申请日2010-01-28

分类号H03M1/10;H03M3/02;

国家 US

入库时间 2022-08-21 17:29:20

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1. 校准集成电路的时间常数的系统和设有此系统的集成电路 [P] . 中国专利： CN102301591B . 2015.04.29

2. 校准集成电路的时间常数的系统和设有此系统的集成电路 [P] . 中国专利： CN102301591A . 2011-12-28

3. SYSTEM FOR CALIBRATING A TIME CONSTANT OF AN INTEGRATED CIRCUIT, AND INTEGRATED CIRCUIT PROVIDED WITH SUCH A SYSTEM. [P] . 欧洲知识产权局专利： EP2382708B1 . 2017-12-27

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4. System for calibrating a time constant of an integrated circuit, and integrated circuit provided with such a system [P] . 美国专利： US8610610B2 . 2013-12-17

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5. SYSTEM FOR CALIBRATING A TIME CONSTANT OF AN INTEGRATED CIRCUIT, AND INTEGRATED CIRCUIT PROVIDED WITH SUCH A SYSTEM. [P] . 欧洲知识产权局专利： EP2382708A2 . 2011-11-02

机译：用于校准集成电路的时间常数的系统，以及具有该系统的集成电路。

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