首页> 外国专利> Electrostatic discharge protection method and device for semiconductor device including an electrostatic discharge protection element providing a discharge path of a surge current

Electrostatic discharge protection method and device for semiconductor device including an electrostatic discharge protection element providing a discharge path of a surge current

机译:包括用于提供浪涌电流的放电路径的静电放电保护元件的半导体装置的静电放电保护方法和装置

摘要

An electrostatic discharge protection device includes a first bipolar transistor having a collector terminal connected with a first power supply terminal, an emitter terminal connected with the input/output terminal, and a base terminal connected with a second power supply terminal, a second bipolar transistor having a collector terminal connected with the second power supply terminal, an emitter terminal connected with the input/output terminal, and a base terminal connected with the first power supply terminal, one of the first and second bipolar transistors ensuring a continuity between the collector terminal and emitter terminal under such conditions that a potential difference between the first or second power supply terminal and the input/output terminal is lower than a breakdown voltage at a PN junction between the emitter terminal and the base terminal of the other bipolar transistor.
机译:静电放电保护装置包括:第一双极型晶体管,其具有与第一电源端子连接的集电极端子,与输入/输出端子相连接的发射极端子,和与第二电源端子连接的基极端子。与第二电源端子连接的集电极端子,与输入/输出端子连接的发射极端子和与第一电源端子连接的基极端子,第一和第二双极晶体管中的一个确保集电极端子和第二端子之间的连续性。在第一或第二电源端子与输入/输出端子之间的电势差低于另一个双极晶体管的发射极端子与基极端子之间的PN结处的击穿电压的条件下,发射极端子。

著录项

  • 公开/公告号US8115270B2

    专利类型

  • 公开/公告日2012-02-14

    原文格式PDF

  • 申请/专利权人 TAKAYUKI NAGAI;

    申请/专利号US201113064087

  • 发明设计人 TAKAYUKI NAGAI;

    申请日2011-03-04

  • 分类号H01L23/60;

  • 国家 US

  • 入库时间 2022-08-21 17:28:26

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