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Quantum efficiency measurement apparatus and quantum efficiency measurement method

机译:量子效率测量装置和量子效率测量方法

摘要

A sample that is an object whose quantum efficiency is to be measured, and a standard object having a known reflectance characteristic are each attached to a sample window provided in a plane mirror. Based on respective spectrums measured by a spectrometer in respective cases where the sample is attached and the standard object is attached, the quantum efficiency of the sample is measured. The plane of an opening of an observation window is made substantially coincident with the exposed surface of the sample or standard object, so that direct incidence, on the observation window, of the fluorescence generated from the sample receiving an excitation light and the excitation light reflected from sample is prevented.
机译:作为要测量其量子效率的物体的样品和具有已知反射率特性的标准物体分别附接到设置在平面镜中的样品窗。基于在附有样品并且附有标准物体的各个情况下由光谱仪测量的各个光谱,测量样品的量子效率。使观察窗的开口平面与样品或标准物的暴露表面基本重合,从而使从接收激发光的样品产生的荧光和反射的激发光直接入射到观察窗上。防止样品脱落。

著录项

  • 公开/公告号US8119996B2

    专利类型

  • 公开/公告日2012-02-21

    原文格式PDF

  • 申请/专利权人 KAZUAKI OHKUBO;

    申请/专利号US20090520975

  • 发明设计人 KAZUAKI OHKUBO;

    申请日2009-01-20

  • 分类号G01J1/04;

  • 国家 US

  • 入库时间 2022-08-21 17:27:33

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