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Method for dimension conversion difference prediction, method for manufacturing photomask, method for manufacturing electronic component, and program for dimension conversion difference prediction

机译:尺寸转换差预测方法,光掩模的制造方法,电子零件的制造方法以及尺寸转换差预测程序

摘要

A method for dimension conversion difference prediction includes: determining an opening angle at a conversion difference prediction point on basis of a design pattern data; and predicting a dimension conversion difference on basis of correlation between the opening angle and an actual measurement value of the dimension conversion difference, or a method for dimension conversion difference prediction includes: determining an incident amount of incident objects at a conversion difference prediction point on basis of a design data; and predicting a dimension conversion difference on basis of correlation between the incident amount and an actual measurement value of the dimension conversion difference.
机译:一种用于尺寸转换差异预测的方法,包括:基于设计图案数据确定在转换差异预测点的开口角;以及所述基于所述开口角度与所述尺寸转换差的实测值之间的相关性预测尺寸转换差,所述尺寸转换差预测方法包括:基于所述转换差预测点确定入射物体的入射量。设计数据;基于入射量与尺寸转换差的实际测量值之间的相关性来预测尺寸转换差。

著录项

  • 公开/公告号US8171434B2

    专利类型

  • 公开/公告日2012-05-01

    原文格式PDF

  • 申请/专利权人 KATSUMI IYANAGI;

    申请/专利号US20080238018

  • 发明设计人 KATSUMI IYANAGI;

    申请日2008-09-25

  • 分类号G06F17/50;

  • 国家 US

  • 入库时间 2022-08-21 17:26:44

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