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High power and high temperature semiconductor power devices protected by non-uniform ballasted sources

机译:受非均匀镇流电源保护的高功率和高温半导体功率器件

摘要

A semiconductor power device is formed on a semiconductor substrate. The semiconductor power device includes a plurality of transistor cells distributed over different areas having varying amount of ballasting resistances depending on a local thermal dissipation in each of the different areas. An exemplary embodiment has the transistor cells with a lower ballasting resistance formed near a peripheral area and the transistor cells having a higher ballasting resistance are formed near a bond pad area. Another exemplary embodiment comprises cells with a highest ballasting resistance formed in an area around a wire-bonding pad, the transistor cells having a lower resistance are formed underneath the wire-bonding pad connected to bonding wires for dissipating heat and the transistor cells having a lowest ballasting resistance are formed in an areas away from the bonding pad.
机译:半导体功率器件形成在半导体衬底上。半导体功率器件包括分布在不同区域上的多个晶体管单元,这些晶体管单元具有取决于每个不同区域中的局部热耗散而变化的镇流电阻量。示例性实施例具有在周边区域附近形成的具有较低镇流电阻的晶体管单元,并且在接合焊盘区域附近形成具有较高的镇流电阻的晶体管单元。另一个示例性实施例包括在引线键合焊盘周围的区域中形成的具有最高镇流电阻的单元,具有较低电阻的晶体管单元形成在连接至用于散热的键合线的引线键合焊盘的下方,并且具有最低的晶体管单元。在远离接合垫的区域中形成镇流电阻。

著录项

  • 公开/公告号US8110472B2

    专利类型

  • 公开/公告日2012-02-07

    原文格式PDF

  • 申请/专利权人 FRANÇOIS HÉBERT;ANUP BHALLA;

    申请/专利号US201113199251

  • 发明设计人 FRANÇOIS HÉBERT;ANUP BHALLA;

    申请日2011-08-23

  • 分类号H01L21/331;H01L21/8222;

  • 国家 US

  • 入库时间 2022-08-21 17:25:59

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