首页> 外国专利> Gage for measuring mini-strip displacement for determining intensity

Gage for measuring mini-strip displacement for determining intensity

机译:测量微带位移的量规以确定强度

摘要

A gage for measuring deflection of a “mini-strip” used to determine peening intensity in small cavities and crevices of a work piece includes a pair of platforms made of a magnetic material spaced apart in a non-magnetic fixture a distance substantially the same as the length of the mini-strip. The platforms have a diameter slightly larger than the width of the mini-strip to provide support for both corners on each end of the mini-strip. A magnet for each of the platforms may be advanced toward and retracted from the platform to adjust the degree of magnetic attraction of the mini-strip. The platforms are stepped to define a shoulder and posts are offset from one of the platforms which cooperate to guide the user in proper placement of the strip. A plunger extended from the indicator engages the strip at substantially its midpoint, to thereby measure the deflection of the strip to give an indication of peening intensity.
机译:一种用于测量“微带”挠度的量规,该微带用于确定工件的小腔和缝隙中的喷丸强度,包括一对由磁性材料制成的平台,这些平台在非磁性夹具中间隔开,其距离与迷你条的长度。平台的直径略大于微带的宽度,以为微带两端的两个角提供支撑。用于每个平台的磁体可以朝着平台前进或从平台缩回,以调节微带的磁引力的程度。平台被阶梯状地限定肩部,并且柱从平台之一偏移,该平台协作以引导使用者正确地放置条带。从指示器伸出的柱塞基本上在其中点处与条带接合,从而测量条带的挠度以给出喷丸强度的指示。

著录项

  • 公开/公告号US8091406B1

    专利类型

  • 公开/公告日2012-01-10

    原文格式PDF

  • 申请/专利权人 JACK CHAMPAIGNE;

    申请/专利号US20090480460

  • 发明设计人 JACK CHAMPAIGNE;

    申请日2009-06-08

  • 分类号G01N3/34;

  • 国家 US

  • 入库时间 2022-08-21 17:25:44

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号