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Method and structure of monolithically integrated IC-MEMS oscillator using IC foundry-compatible processes

机译:使用IC代工厂兼容工艺的单片集成IC-MEMS振荡器的方法和结构

摘要

The present invention relates to integrating an inertial mechanical device on top of an IC substrate monolithically using IC-foundry compatible processes. The IC substrate is completed first using standard IC processes. A thick silicon layer is added on top of the IC substrate. A subsequent patterning step defines a mechanical structure for inertial sensing. Finally, the mechanical device is encapsulated by a thick insulating layer at the wafer level. Compared with the incumbent bulk or surface micromachined MEMS inertial sensors, vertically monolithically integrated inertial sensors provided by embodiments of the present invention have one or more of the following advantages: smaller chip size, lower parasitics, higher sensitivity, lower power, and lower cost.
机译:本发明涉及利用IC铸造兼容工艺将惯性机械装置单片集成在IC衬底的顶部。首先使用标准IC工艺完成IC基板。在IC衬底的顶部上添加厚的硅层。随后的构图步骤定义了用于惯性感测的机械结构。最终,机械设备被厚厚的绝缘层封装在晶圆级。与现有的整体或表面微机械MEMS惯性传感器相比,本发明的实施例提供的垂直单片集成的惯性传感器具有以下优点中的一个或多个:芯片尺寸较小,寄生效应较小,灵敏度较高,功耗较低且成本较低。

著录项

  • 公开/公告号US8071398B1

    专利类型

  • 公开/公告日2011-12-06

    原文格式PDF

  • 申请/专利权人 XIAO (CHARLES) YANG;

    申请/专利号US20090634634

  • 发明设计人 XIAO (CHARLES) YANG;

    申请日2009-12-09

  • 分类号G01R31/26;

  • 国家 US

  • 入库时间 2022-08-21 17:25:46

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