首页> 外国专利> NAND based NMOS NOR flash memory cell, a NAND based NMOS NOR flash memory array, and a method of forming a NAND based NMOS NOR flash memory array

NAND based NMOS NOR flash memory cell, a NAND based NMOS NOR flash memory array, and a method of forming a NAND based NMOS NOR flash memory array

机译:基于NAND的NMOS NOR闪存存储单元,基于NAND的NMOS NOR闪存存储阵列以及形成基于NAND的NMOS NOR闪存存储阵列的方法

摘要

A NOR flash nonvolatile memory device provides the memory cell size and a low current program process of a NAND flash nonvolatile memory device and the fast, asynchronous random access of a NOR flash nonvolatile memory device. The NOR flash nonvolatile memory device has an array of NOR flash nonvolatile memory circuits that includes charge retaining transistors serially connected in a NAND string such that at least one of the charge retaining transistors functions as a select gate transistor to prevent leakage current through the charge retaining transistors when the charge retaining transistors is not selected for reading. The topmost charge retaining transistor's drain is connected to a bit line parallel to the charge retaining transistors and the bottommost charge retaining transistor's source is connected to a source line and is parallel to the bit line. The charge retaining transistors are programmed and erased with a Fowler-Nordheim tunneling process.
机译:NOR闪存非易失性存储设备提供了NAND​​闪存非易失性存储设备的存储单元尺寸和低电流编程过程,以及NOR闪存非易失性存储设备的快速,异步随机存取。 NOR闪存非易失性存储器件具有NOR闪存非易失性存储电路的阵列,该阵列包括串联连接在NAND串中的电荷保持晶体管,使得电荷保持晶体管中的至少一个用作选择栅晶体管,以防止通过电荷保持的泄漏电流。未选择电荷保持晶体管进行读取时的晶体管。最顶部的电荷保持晶体管的漏极连接到与电荷保持晶体管平行的位线,而最底部的电荷保持晶体管的源极连接到源极线并且与位线平行。电荷保持晶体管通过Fowler-Nordheim隧穿过程进行编程和擦除。

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