A system and method for testing a data storage device without revealing memorycontent. To control the individual bits of the memory during testing eachvalue is written into the memory according to the equation NEW_DATA =CURRENT_DATA XOR DATA_SEED such that individual bits of NEW_DATA are equal toCURRENT_DATA with selected bits inverted when the corresponding positions inDATA_SEED are high. NEW_DATA is written into the memory, read out andverified, so that all bit positions can be controlled and tested in both logicstates, while NEW_DATA and CURRENT_DATA are not ascertainable by the testingsoftware.
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