NEW_DATA=CURRENT_DATA XOR DATA_SEEDsuch that individual bits of NEW_DATA are equal to CURRENT_DATA with selected bits inverted when the corresponding positions in DATA_SEED are high. NEW_DATA is written into the memory, read out and verified, so that all bit positions can be controlled and tested in both logic states, while NEW_DATA and CURRENT_DATA are not ascertainable by the testing software."/>
System and method for testing a data storage device without revealing memory content
A system and method for testing a data storage device without revealing memory content. To control the individual bits of the memory during testing each value is written into the memory according to the equationNEW_DATA=CURRENT_DATA XOR DATA_SEEDsuch that individual bits of NEW_DATA are equal to CURRENT_DATA with selected bits inverted when the corresponding positions in DATA_SEED are high. NEW_DATA is written into the memory, read out and verified, so that all bit positions can be controlled and tested in both logic states, while NEW_DATA and CURRENT_DATA are not ascertainable by the testing software.
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机译：在不显示存储器内容的情况下测试数据存储设备的系统和方法。为了在测试过程中控制存储器的各个位，根据等式将每个值写入存储器<？in-line-formulae description =“在线表达式” end =“ lead”？> NEW_DATA = CURRENT_DATA XOR DATA_SEED <？in-line-formulae description =“在线表达式” end =“ tail”？>这样，当DATA_SEED中的相应位置为高时，NEW_DATA的各个位与CURRENT_DATA相等，而所选位被反转。将NEW_DATA写入存储器，读出并验证，以便可以在两种逻辑状态下控制和测试所有位的位置，而测试软件无法确定NEW_DATA和CURRENT_DATA。
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