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SPECTRAL REFLECTIVITY MEASURING DEVICE AND SPECTRAL REFLECTIVITY MEASURING METHOD

机译:光谱反射率测定装置及光谱反射率测定方法

摘要

Disclosed is a spectral reflectivity measuring device (1) provided with a reflection calibration plate (4), a plurality of optical filters (5) for transmitting light with different wavelengths therethrough, an image capturing unit (6), and a calculation processing unit (7). A plurality of images of an object to be measured (3) and the reflection calibration plate (4) are acquired while changing the optical filters (5). In the reflection calibration plate (4), a plurality of reflection calibration sections (4a) having different spectral reflectivities are formed, and the spectral reflectivities of the respective reflection calibration sections (4a) are known. In the calculation processing unit (7), the plurality of images of the object to be measured (3) and the reflection calibration plate (4), which are captured via the respective optical filters (5), are processed, and the spectral reflectivity of the object to be measured (3) is derived by a predetermined calculation.
机译:公开了一种光谱反射率测量装置(1),其具有反射校准板(4),多个用于透射具有不同波长的光的滤光器(5),图像捕获单元(6)和计算处理单元( 7)。在更换滤光器(5)的同时,获取要测量的物体(3)和反射校准板(4)的多个图像。在反射校准板(4)中,形成具有不同光谱反射率的多个反射校准部(4a),并且各个反射校准部(4a)的光谱反射率是已知的。在计算处理单元(7)中,处理经由各个滤光器(5)捕获的待测对象(3)和反射校准板(4)的多个图像,并且光谱反射率通过预定的计算来推导被测物体(3)的“α”。

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