METHOD FOR PROCESSING SPECTRA OF RADIATION SCATTERED BY A MATERIAL IN ORDER TO OBTAIN A BASIC SPECTRUM OF RADIATION SCATTERED BY SAID MATERIAL, DEVICE AND ASSOCIATED COMPUTER PROGRAM

摘要

The invention relates to a method for obtaining a basic spectrum of radiation scattered by a material (100), in which: the material is exposed to an incident irradiation beam (115) emitted by a radiation source (110); a first spectrum (150) of radiation scattered by the material (100) is measured by means of a principal detector (120), arranged such that the field of observation thereof (130) intersects the irradiation beam (115) within the material (100); at least one other spectrum (152, 154, 156) of radiation scattered by the material (100), termed secondary spectrum, is measured by means of at least one secondary detector (122, 124, 126); a matrix of the measurements (X) is formed from the spectra previously measured; said matrix of measurements is broken up into two non-negative matrices, namely a weight matrix (A) and a spectrum matrix (S), the latter comprising an estimated multiple scattered radiation spectrum and an estimated primary scattered radiation spectrum.