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METHOD FOR PROCESSING SPECTRA OF RADIATION SCATTERED BY A MATERIAL IN ORDER TO OBTAIN A SPECTRUM OF RADIATION SINGLE SCATTERED BY SAID MATERIAL, DEVICE AND ASSOCIATED COMPUTER PROGRAM
METHOD FOR PROCESSING SPECTRA OF RADIATION SCATTERED BY A MATERIAL IN ORDER TO OBTAIN A SPECTRUM OF RADIATION SINGLE SCATTERED BY SAID MATERIAL, DEVICE AND ASSOCIATED COMPUTER PROGRAM
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机译:一种处理材料散射的辐射光谱的方法,以获取所述材料,装置和相关计算机程序散射的辐射单一光谱
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摘要
A method and device for obtaining a first radiation spectrum diffused through a material, in which the material is exposed to an incident irradiation beam emitted by a radiation source. A first radiation spectrum diffused through the material is measured by means of a main detector, arranged so that its observation field intersects the irradiation beam inside the material. At least one secondary radiation spectrum diffused through the material is measured by means of at least one secondary detector and a measurements matrix (X) is constructed starting from previously measured spectra. The measurements matrix is decomposed in two non-negative matrices, a weights matrix (A) and a spectra matrix (S), where the spectra matrix includes an estimated multiple diffuse radiation spectrum and an estimated primary diffuse radiation spectrum. The device includes a microprocessor and computer program. A computer program product for implementing the method is also provided.
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