首页> 外国专利> METHOD FOR PROCESSING SPECTRA OF RADIATION SCATTERED BY A MATERIAL IN ORDER TO OBTAIN A SPECTRUM OF RADIATION SINGLE SCATTERED BY SAID MATERIAL, DEVICE AND ASSOCIATED COMPUTER PROGRAM

METHOD FOR PROCESSING SPECTRA OF RADIATION SCATTERED BY A MATERIAL IN ORDER TO OBTAIN A SPECTRUM OF RADIATION SINGLE SCATTERED BY SAID MATERIAL, DEVICE AND ASSOCIATED COMPUTER PROGRAM

机译:一种处理材料散射的辐射光谱的方法,以获取所述材料,装置和相关计算机程序散射的辐射单一光谱

摘要

A method and device for obtaining a first radiation spectrum diffused through a material, in which the material is exposed to an incident irradiation beam emitted by a radiation source. A first radiation spectrum diffused through the material is measured by means of a main detector, arranged so that its observation field intersects the irradiation beam inside the material. At least one secondary radiation spectrum diffused through the material is measured by means of at least one secondary detector and a measurements matrix (X) is constructed starting from previously measured spectra. The measurements matrix is decomposed in two non-negative matrices, a weights matrix (A) and a spectra matrix (S), where the spectra matrix includes an estimated multiple diffuse radiation spectrum and an estimated primary diffuse radiation spectrum. The device includes a microprocessor and computer program. A computer program product for implementing the method is also provided.
机译:一种用于获得扩散通过材料的第一辐射光谱的方法和装置,其中该材料暴露于由辐射源发射的入射辐射束。借助主探测器测量扩散通过材料的第一辐射光谱,该探测器的布置使其观察场与材料内部的辐射束相交。借助于至少一个次级检测器来测量通过材料扩散的至少一个次级辐射光谱,并且从先前测量的光谱开始构造测量矩阵(X)。将测量矩阵分解为两个非负矩阵:权重矩阵(A)和光谱矩阵(S),其中光谱矩阵包括估计的多重散射辐射光谱和估计的一次散射光谱。该设备包括微处理器和计算机程序。还提供了用于实现该方法的计算机程序产品。

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